| Ditemukan 264 dokumen dengan kata kunci 9536 |
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General Test Overlap Control: Improved Algorithm for CAT and CCT
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| Pengarang: Shu-Ying Chen | No. Panggil: Applied Psychological Measurement, Vol.38, No.3, May 2014 p.229-244 |
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General Test Overlap Control: Improved Algorithm for CAT and CCT
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An Enhanced Approach to Combine Item Response TheoryWith Cognitive Diagnosis in Adaptive Testing
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| Pengarang: Chun Wang, Chanjin Zheng, Hua-Hua Chang | No. Panggil: Journal of Educational Measurement, Vol.51, No.4, 2014 Winter p.358-380 |
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Foundations of Psychological Testing
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If at First You Don’t Succeed, Try, Try Again: Applications of Sequential IRT Models to Cognitive Assessments
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| Pengarang: Steven Andrew Culpepper | No. Panggil: Applied Psychological Measurement, Vol.38, No.8, Nov 2014 p.632-644 |
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Bayesian Networks in Educational Assessment: The State of The Field
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If at First You Don't Succeed, Try, Try Again: Applications of Sequential IRT Models to Cognitive Assessments
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Local Equating of Cognitively Diagnostic Modeled Observed Scores
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| Pengarang: Tao Xin, Jiahui Zhang | No. Panggil: Applied Psychological Measurement, Vol.39, No.1,Jan 2015 p.44-61 |
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An Enhanced Approach to Combine Item Response Theory With Cognitive Diagnosis in Adaptive Testing
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Local Equating of Cognitively Diagnostic Modeled Observed Scores
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