Hasil Pencarian
	Ditemukan 10 dokumen dengan kata kunci 3883 Simpan CSV  Editor's choice: Quantitative annular dark-field imaging of single-layer graphene Pengarang: Shunsuke Yamashita, Shogo Koshiya, Kazuo Ishizuka, and Koji Kimoto | No. Panggil: Microscopy (Volume 64 Issue 2 April 2015, p. 143-150) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Membuat aplikasi sistem pakar PHP dan editor DREAMWEAVER Pengarang: Bunafit Nugroho | No. Panggil: 005.368 BUN m | Koleksi: Buku Teks  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Phase reconstruction in annular bright-field scanning transmission electron microscopy Pengarang: Takafumi Ishida, Tadahiro Kawasaki, Takayoshi Tanji, Tetsuji Kodama, dll | No. Panggil: Microscopy (Volume 64 Issue 2 April 2015, p. 69-76) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Quantitative evaluation of annular bright-field phase images in STEM Pengarang: Takafumi Ishida, Tadahiro Kawasaki, Takayoshi Tanji, and Takashi Ikuta | No. Panggil: Microscopy (Volume 64 Issue 2 April 2015, p. 121-128) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Three-dimensional volume imaging with electron microscopy toward connectome Pengarang: Nobuhiko Ohno, Mitsuhiko Katoh, Yurika Saitoh, Sei Saitoh, dll | No. Panggil: Microscopy (Volume 64 Issue 1 February 2015, p. 17-26) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Possibility of high-resolution ptychographic iterative imaging with low energy electrons: dynamical calculations Pengarang: Ling Wang, Cheng Liu, and John M. Rodenburg | No. Panggil: Microscopy (Volume 64 Issue 2 April 2015, p. 105-110) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Rapid contrast evaluation method based on affinity beads and backscattered electron imaging for the screening of electron stains Pengarang: Hiroki Kaku, Kanako Inoue, Yoshinori Muranaka, Pyoyun Park, dll | No. Panggil: Microscopy (Volume 64 Issue 5 Oktober 2015, p. 361-368) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Effects of non-rotationally symmetric aberrations on the quantitative measurement of lattice positions in a graphene monolayer using high-resolution transmission electron microscopy Pengarang: Fang Lin,Jiajun Jian, Lvshan Ye, and Chuanhong Jin | No. Panggil: Microscopy (Volume 64 Issue 5 Oktober 2015, p. 311-318) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Editor's Choice: Resolving 45-pm-separated Si–Si atomic columns with an aberration-corrected STEM Pengarang: Hidetaka Sawada, Naoki Shimura, Fumio Hosokawa, Naoya Shibata, dll | No. Panggil: Microscopy (Volume 64 Issue 3 June 2015, p. 213-217) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  :: Editor's choice: Local cluster symmetry of a highly ordered quasicrystalline Al58Cu26Ir16 extracted through multivariate analysis of STEM images Pengarang: Takehito Seki and Eiji Abe | No. Panggil: Microscopy (Volume 64 Issue 5 Oktober 2015, p. 341-349) | Koleksi: e-Article Oxford Journal  :: Cari yang mirip  :: Tambahkan ke Favorit  ::